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A Z-pinch wire array load voltage measuring device and method

A technology of load voltage and measurement method, which is applied in the direction of measuring device, measuring electrical variable, measuring current/voltage, etc., can solve the problems of difficult interpretation of measurement results and immature means, and achieve high reuse efficiency, compact structure, and excellent results. Reasonable and accurate effect

Inactive Publication Date: 2018-01-19
NORTHWEST INST OF NUCLEAR TECH
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Problems solved by technology

[0006] Based on the above experimental results, it can be seen that as far as the current situation is concerned, the technology of using stacked resistor dividers to measure the load voltage of wire arrays is still in the experimental stage, and the means are not very mature. No matter the measurement results on the Saturn device or the MAGPIE device There are parts that are difficult to explain, which also shows that load voltage measurement is still very challenging

Method used

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  • A Z-pinch wire array load voltage measuring device and method
  • A Z-pinch wire array load voltage measuring device and method
  • A Z-pinch wire array load voltage measuring device and method

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Embodiment Construction

[0040] see figure 1 and figure 2 , The main installation structure of Z pinch wire array load includes anode plate 1, cathode plate 2, transition flange 3, wire array cone seat 4, return column 5 and wire array 6. It can be seen from the figure that if the wire array load voltage is recorded as V A , the voltage between the anode plate and the cathode plate is recorded as V C , the current in the loop is marked as I, and the inductance of the wire array flange and cone seat is marked as L P , then according to Ampere’s loop law:

[0041]

[0042] Therefore, if the voltage V between the cathode and anode plates can be obtained C and inductance L P , then the current I (or current differential dI / dt) can be combined with the formula to obtain the wire array load voltage V a .

[0043] The method for obtaining the current I and the current differential dI / dt in the loop is very mature, and the current differential signal can be obtained directly by using the current di...

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Abstract

The invention relates to a device for measuring the load voltage of a Z-pinch wire array and a method for measuring the load voltage of a Z-pinch wire array based on the device. The voltage measurement device provided by the present invention includes a capacitive voltage divider and a current differential probe installed on the anode plate; the capacitive voltage divider includes a copper electrode, a ground electrode, an integrating resistor and a voltage signal output port; the copper electrode and the ground electrode pass through The insulating film forms a low-voltage capacitor; the copper electrode and the cathode plate form a high-voltage capacitor; the integrating resistor is connected to the low-voltage capacitor through a wire; the current differential probe is used to directly obtain the current differential signal in the loop. The present invention can calculate the load voltage of the Z-pinch wire array by installing a capacitive voltage divider and a current differential probe in combination with the ampere loop law, and the calculation result is reasonable and accurate.

Description

technical field [0001] The invention relates to a Z-pinch wire array load voltage measuring device and a voltage measuring method based on the device. Background technique [0002] The high-power Z-pinch is to use the metal wire array load to discharge under high current to form plasma, implode to the center under the action of strong magnetic field, and finally radiate strong X-rays. Z-pinch technology can be used to carry out research related to inertial confinement fusion, weapon physics simulation, plasma radiation, laboratory astrophysics, high energy density physics, etc. [0003] So far, there are still many basic physical problems in the field of Z-pinch research that have not been fully elucidated. Among them, the voltage measurement method during the Z-pinch process of the wire array load has not yet been completely resolved. This is because the load voltage measurement is affected by various unfavorable factors such as small measurement space (~1cm), high voltag...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R19/00
Inventor 王亮平李沫张金海张信军吴撼宇
Owner NORTHWEST INST OF NUCLEAR TECH
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