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A Method for Characterizing Amorphous-Crystal Transition Dynamics Using High Energy X-rays

A technology of dynamic characteristics and dynamic characteristics, which is used in material analysis, scientific instruments, instruments, etc. using wave/particle radiation, and can solve problems such as inability to analyze microscopic and atomic migration and diffusion laws.

Active Publication Date: 2022-03-15
SHANDONG JIANZHU UNIV
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Problems solved by technology

[0008] The technical problem to be solved by the present invention is to change the traditional method of analyzing the kinetic characteristics of alloy amorphous-crystal transformation through thermal performance testing, and solve the problem that the traditional thermal analysis method cannot analyze the microscopic and atomic migration and diffusion laws in the crystallization process. The combination of diffraction analysis technology and numerical simulation is used to obtain the atomic migration and diffusion process, the formation and growth mechanism of crystal nuclei, and the kinetic characteristics of amorphous-crystal transition during the nanocrystallization process of amorphous alloys, so as to characterize the properties of amorphous alloys. nanocrystallization process

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  • A Method for Characterizing Amorphous-Crystal Transition Dynamics Using High Energy X-rays
  • A Method for Characterizing Amorphous-Crystal Transition Dynamics Using High Energy X-rays
  • A Method for Characterizing Amorphous-Crystal Transition Dynamics Using High Energy X-rays

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Embodiment

[0027] The test adopts the atomic percentage as Zr 49 Cu 36 Al 8 be 7 of amorphous alloys.

[0028] a. Select the nominal composition (atomic percentage) as Zr 49 Cu 36 Al 8 be 7 The amorphous alloy is used as the object, and the bulk amorphous alloy of Φ5×100mm is obtained through vacuum arc melting (repeated smelting 5 times) and copper mold suction casting, and is cut into alloy samples of Φ5×0.5mm;

[0029] b. Place the sample in the high-energy X-ray (wavelength 0.01nm) diffraction optical path for ex-situ isothermal crystallization treatment, the processing temperature is 486°C, and the diffraction data collection frequency is 6min to obtain ex-situ radiation data, I M (2θ), see appendix figure 1 ;

[0030] c. Correct and convert the obtained diffraction data to obtain the alloy-to-alloy interference function I(Q) and structure factor function S(Q) (partial data), see attached figure 2 , and perform Fourier transform to obtain the reduced radial distribution f...

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Abstract

A method for characterizing the kinetic properties of amorphous-crystal transitions with high-energy X-rays, belonging to the technical field of nanocrystalline alloy preparation, by performing Fourier transform and structure function derivation on diffraction data to obtain the distribution of atoms in the matrix under different time conditions Data, and use a specific JMA equation for segmental fitting to obtain the Avrami index, based on which the amorphous-to-crystal transition kinetics analysis is performed, making the analysis method more convenient and accurate.

Description

technical field [0001] The invention belongs to the technical field of preparation of nanocrystalline materials and the technical field of amorphous alloys, and relates to a technical method for characterizing the nanocrystallization characteristics of amorphous alloys, in particular to a method for characterizing the kinetic characteristics of amorphous-crystal transitions with high-energy X-rays. Background technique [0002] Amorphous alloy is a new generation of metal materials with long-range disorder and short-range order structure. It has the characteristics of uniform structure and uniform composition, so it has a series of excellent mechanical, physical and chemical properties, such as high strength, high hardness, processing It has excellent characteristics such as good molding, and has a wide range of applications in aerospace, military, medical equipment and other fields. [0003] Nanocrystallization of amorphous alloys is a promising process for obtaining materi...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/207G01N25/20
CPCG01N23/207G01N25/20
Inventor 徐勇张云瑞陈可欣徐丽丽许超沈向丞商雨新谷子丰武律久石磊
Owner SHANDONG JIANZHU UNIV
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