A capacitor life estimation method, device and electronic equipment

One or more embodiments in this application provide a capacitor life estimation method, device, and electronic equipment, including: obtaining capacitance characteristic values; establishing an early prediction model group, a mid-term prediction model group, and a late prediction model; the early prediction model group is based on the first One training set is trained to obtain, the mid-term prediction model group is obtained based on the second training set training, and the late prediction model is obtained based on the third training set training; the capacitance characteristic value is input into the early prediction model group to determine the prediction result of the early prediction model group; the capacitance Inputting the eigenvalues ​​into the mid-term prediction model to determine the prediction results of the mid-term prediction model group; inputting the capacitance eigenvalues ​​into the late prediction model to determine the prediction results of the late prediction model; performing capacitor life estimation based on the capacitor aging test and according to at least one prediction result. The present application can solve the problems in the prior art that there are large errors in life estimation of capacitors based on aging tests and individual differences in capacitors cannot be avoided.