The invention relates to a photoelectric response characteristic calibration method for a two-dimensional imaging device, which comprises a 
ray diffraction grating, a focusing optical 
system, a two-dimensional imaging device to be calibrated and a computer 
system, wherein an incident 
light beam for calibrating the two-dimensional imaging device is a 
light beam parallel to the plane, the 
light beam is imaged on the photosensitive surface of the two-dimensional imaging device after being modulated by the space intensity of the 
ray diffraction grating and being converged by the focusing optical 
system, the incident light beam forms a series of 
diffraction sub light spots with modulated 
light intensity on the photosensitive surface of the two-dimensional imaging device through the 
beam splitting characteristic of the 
ray diffraction grating, a plurality of groups of measured data are fused through 
peak value measuring data of each diffraction sub 
light spot and 
peak value theoretical dataobtained by theoretical calculation, the measured data and the corresponding theoretical data are obtained, the two groups of data are combined for completing the photoelectric response characteristic calibration of the two-dimensional imaging device. The photoelectric response characteristic calibration method has high 
light energy utilization rate, is applicable to the photoelectric response characteristic calibration of the two-dimensional imaging device under the condition with strong light sources and is also applicable to weak light sources, and the calibration range is enlarged throughthe fusion of a plurality of groups of measured data.