The invention provides an interface 
signal quality testing method and an interface 
signal quality testing 
system based on a special 
chip. The method comprises a first step of obtaining 
signal eye pattern templates corresponding to all physical interfaces on the special 
chip, a second step of selecting the physical interfaces of the special 
chip one by one as an object to be tested, starting a signal collecting function of the special chip to collect a plurality of sets of 
eye height and eye width data corresponding to different time on the 
physical interface, and drawing a signal 
eye pattern corresponding to the 
physical interface according to the plurality of sets of the 
eye height and eye width data, and a third step of comparing the signal 
eye pattern of the tested 
physical interface with the corresponding signal eye pattern template and judging whether a track of the signal eye pattern of the physical interface is located on the outer periphery of the corresponding eye pattern template, wherein 
signal quality is up to predetermined requirements if the track of the signal eye pattern of the physical interface is located on the outer periphery of the corresponding eye pattern template and the 
signal quality is not up to the predetermined requirements if not. The interface 
signal quality testing 
system does not need to depend on a 
signal analyzer or participation of workers, and is high in accuracy, low in cost and capable of meeting testing requirements during 
mass production of switching equipment.