A differential interference contrast (DIC) 
microscope system is provided comprising: (a) an illumination source for illuminating a sample ; (b) a lens 
system for viewing the illuminated sample, including an objective, defining an 
optical axis; (c) at least one 
detector system for receiving a 
sample image; (d) mechanisms for 
wavelength multiplexing the shear direction or shear magnitude or both on the sample and demultiplexing the 
resultant DIC images on the 
detector; and (e) a mechanism for modulating the phase of the interference image. Various approaches are disclosed to accomplish 
wavelength multiplexing of shear direction and demultiplexing the two DIC images that result. It is possible for the two, 
wavelength multiplexed DIC images to differ in either or both shear direction or magnitude. These approaches include (1) two DIC microscopes, each operating at a different wavelength, but which share a single objective through a 
beam splitter; (2) a segmented DIC 
prism that is made in four sections where opposite sections are paired and have the same shear direction and amount, and each pair of sections have filters transmitting different wavelengths; (3) a segmented DIC 
prism that is located in or near an aperture stop or 
pupil of said DIC 
microscope to obtain data in two shear directions that is multiplexed by wavelength; (4) a dual field-of-view optical system with two DIC prisms, one in each path to wavelength 
multiplex shear direction or shear magnitude through said objective; (5) demultiplexing wavelength multiplexed DIC images through the use of a wavelength selective 
beam splitter and two detectors; (6) demultiplexing wavelength multiplexed DIC images through the use of a wavelength 
controlled source and a single 
detector; and (7) demultiplexing wavelength multiplexed DIC images through the use of dual field-of-view 
optics and a single detector. These various approaches permit rapid, robust measurement of slope in two directions. Further, phase shifting and DIC 
microscopy are limited to measurements within the 
depth of focus (DOF) of the objective while WLI 
microscopy is not.